2012 NIST SEMINARS
The 2012 MSC will host the following NIST Seminars. Unless otherwise noted, all Seminars are two full days long and will begin at 8:00am on Monday, March 19th, 2012 and end at 5:00pm on Tuesday, March 20th, 2012. NOTE: Three-day Seminars are denoted with “*” and will end on Wednesday, March 21st, 2012.
N01: Hands-on Workshop on Assessing and Reporting Measurement Uncertainty
(NOTE: 3 day Seminar) *
Will Guthrie and Hung-Kung Liu, NIST Statistical Engineering Division
This workshop on uncertainty evaluation will describe the statistical framework and methods needed to develop uncertainty statements based on the JCGM Guide to the Expression of Uncertainty in Measurement. Methods for uncertainty estimation will be illustrated with practical examples from different metrological areas. The workshop will also include hands-on examples to be analyzed by the participants in class. The hands-on examples will be analyzed using propagation of uncertainty formulas and metRology.xls, a software package that makes open-source tools for statistical metrology from the statistics software R available via Microsoft Excel using RExcel and statconnDCOM.
Pre-requisites:
1. Laptop computers with Microsoft Excel are required to do the hands-on exercises. Participants who have access to a laptop should bring one. Instructions outlining the installation of all additional software needed (available at no charge) will be sent out prior to the workshop. Some extra laptops are also available for those who cannot bring their own. Please contact the instructors in advance if you will need to borrow a laptop.
2. Participants should have some experience with the use of Microsoft Excel for the analysis of data. As part of the hands-on exercises, it will be necessary for participants to be able to copy and paste spreadsheet contents and to enter simple formulas. Advanced knowledge of Excel is not required. Some familiarity with the use of descriptive statistics like the sample mean and standard deviation and experience with basic linear regression analysis would also be helpful, but is not required.
For further information please contact:
Will Guthrie, (301) 975-2854, will.guthrie@nist.gov or
Hung-kung Liu, (301) 975-2178, hung-kung.liu@nist.gov
N02: The 17025 Accreditation Process
Barbara Belzer, Tom Hettenhouser, Dana Leaman, and Sherrie Wentzel, NVLAP
This two-day interactive seminar will assist laboratories in preparation for and understanding of the accreditation process whether the laboratory is new to accreditation or in the renewal process. It’s ideal for orientation for new staff, quality managers, or as a refresher to update your knowledge of the Standard and the accreditation process. An overview of the requirements of the Standard as well as the NVLAP Accreditation process will be provided. Particular emphasis will be placed on Internal Audit and Management Review, Proficiency Testing, preparing your claims of measurement uncertainty (budgets), ensuring the metrological traceability of your calibrations, and the complaint/corrective action process. We’ll give you an overview of the on-site assessment process, covering how they are conducted and by whom. We will also describe how NVLAP and other Accrediting Bodies become signatory and maintain their status with respect to the International Laboratory Accreditation Cooperation Mutual Recognition Arrangement and what it means to your lab.
Intended Audience: Technical and Quality personnel from accredited laboratories as a refresher, those who are seeking accreditation, or those investigating the process.
Bring: Materials will be provided. A laptop may be helpful.
Learning Objectives:
At the end of the two day seminar, using notes and provided resources, participants will be able to:
1. Describe the accreditation process in terms of the NVLAP and ISO/IEC 17025 Procedures and General Requirements (NIST Handbook 150)
2. Analyze the adequacy of a documented management system and technical procedure to fulfill the requirements of the standard
3. Differentiate between an Internal Audit, a Management Review, and an on-site assessment as performed by an Accrediting Body
4. Identify evidence of metrological traceability
5. Identify proper use of the Accrediting Body Mark in terms of NVLAP and international accreditation policies
For further information contact: Barbara Belzer at (301) 975-2248 or barbara.belzer@nist.gov Thomas Hettenhouser at (301) 975-2013 or thomas.hettenhouser@nist.gov Dana Leaman at (301) 975-4679 or dana.leaman@nist.gov Sherrie Wentzel at (301) 975-3994 or sherrie.wentzel@nist.gov
N03: NIST Pressure and Vacuum Measurement
Jay Hendricks, NIST Pressure and Vacuum Group, and Michael Holleron, Navy Primary Standards Laboratory
Making good pressure measurements from ultra-high vacuum to atmospheric pressure requires the correct use of many kinds of gauges and proper use of vacuum technology. Among the most widely used gauges are ionization gauges, spinning rotor gauges, thermal conductivity gauges, capacitance diaphragm gauges, quartz bourdon tube gauges, and resonant silicon gauges. However, the incorrect use of any of these gauges can result in bad measurements that cost time and money.
This two-day course will cover the fundamentals of pressure measurements from 10-8 Pa to 10+5 Pa (10-10 torr to 10+3 torr), focusing on the selection and proper use of appropriate gauging technology for a given application. A survey of calibration techniques will be presented along with recommendations for obtaining best performance. Part of the class time will be devoted to set-up of a simple vacuum calibration system. This will enable live demonstration of some of the gauges discussed in the course, and give students an opportunity to participate in the vacuum system set-up and disassembly.
New for this year will be an overview of good vacuum system design and construction using off-the-shelf vacuum equipment and fittings. Basic vacuum system design do's and don'ts will be covered. Pumping systems, sealing systems, valves, and vacuum plumbing solutions will be briefly covered. Attendees are invited to share their own pressure measurement and or vacuum system design problems for in-class discussion.
For further information, contact:
Jay Hendricks at (301) 975-4836, jay.hendricks@nist.gov
Michael Holleron, Michael.Holleron@navy.mil
N04: Balance Calibration and Use in an Analytical Environment
(NOTE: 3 day Seminar) *
Val Miller, NIST and Mark Ruefenacht, Heusser Neweigh
This NIST Seminar will discuss the sources of weighing errors in analytical environments, methodologies for quantifying the errors, and computation of balance calibration uncertainty. Attention will be given to error sources, selection of standards, and various calibration and testing procedures used in the balance industry. Time will be spent in hands-on exercises calibrating a variety of balances, accumulating data, and developing uncertainty budgets. The focus will then move to use of balances in an analytical environment where compliance with pharmaceutical (FDA/ USP) and international requirements will be discussed and practiced. Methodologies for process measurement assurance techniques in analytical weighing will also be covered. Participants should leave with a working knowledge of balance calibration methods, uncertainty estimation, measurement assurance concepts & minimum balance load computations that can be applied directly to their applications. This NIST Seminar is designed for beginner to advanced users of balances or calibration managers wanting a better understanding of balances and associated uncertainties in organizations where analytical weighing is an integral part of operations. Limited to 30 participants. (Laptop with spreadsheet capability and/ or scientific calculator strongly encouraged.)
For further information, contact:
Val Miller at (301) 975-3602 or val.miller@nist.gov
N05: Flow Measurements and Uncertainties
John Wright, Aaron Johnson, Gina Kline, NIST (2 days)
We will cover background metrology and fluid mechanics subjects that are important for flow measurement including:
• The transition from laminar to turbulent flow
• Pipe flow profiles and boundary layer concepts
• The continuity equation and conservation of mass
• Liquid and gas properties and their calculation
• Pressure and temperature measurement
The operating principles and equation of flow for the commonly used flow measurement techniques will be derived and explained including:
• Differential pressure devices (laminar flowmeters, orifice plates, venturi tubes)
• Critical flow venturis and nozzles
• Ultrasonic flowmeters
• Turbine and positive displacement meters
• Electromagnetic flowmeters
• Coriolis flowmeters
• Thermal meters
• Rotameters
Methods of flowmeter calibration used in laboratory, including NIST standards will be covered. Field conditions will be discussed as well as installation effects and how distorted velocity profiles affect flowmeter accuracy.
Flow calculations and uncertainty analyses for certain flowmeter types will be taught.
The class will have hands on sections where students participate calibrating a flowmeter, reducing the data, and computing the uncertainty of the calibration results.
Our goal is cover topics with a range of physics and mathematical difficulty so that the course will be of interest to students with a wide range of mathematical backgrounds and flowmeter experience. Distributed throughout the course, there will be optional, advanced sections of interest to only extreme flow geeks.
For additional technical information, contact:
Aaron Johnson at (301) 975-5954, aaron.johnson@nist.gov or John Wright at (301) 975-5937, john.wright@nist.gov
N06: Train the Trainer
Georgia Harris and Elizabeth Gentry, NIST
Taking subject matter experts (SME) and simply assigning them to a training function is a common strategy when implementing training. Most SMEs in the measurement sciences are good measurement professionals but don’t necessarily have an educational background. Ongoing professional development of our SMEs in the area of adult educational concepts and methods is critical for 1) designing and implementing effective training; and 2) having an adequate number of trainers or metrologists with training skills to develop the next generation of metrology professionals. This two-day tutorial will cover some essential training design concepts and provide an opportunity to practice what is learned.
Intended Audience: training designers and presenters
Pre-work: Identify a specific class or module you would like to create or update (think about a 30 min presentation or a 1 to 2 hour webinar, or a 4 hour tutorial)
Bring: Electronic resources from your class/module along with a laptop for you to work on during the session
Learning Objectives: At the end of this two day session, using notes and provided resources, participants will be able to:
- Describe educational models and concepts(e.g., ADDIE model, Bloom’s Taxonomy, Teaching Styles, Adult Learning Methods, Partnership Model, Job Task Analysis);
- Analyze performance and learning objectives;
- Write clear and effective learning objectives, analyze learning objectives for others;
- Identify and select suitable openers, closers, and other learning activities, create and demonstrate a learning activity, and provide feedback on others’ activities; and
Identify applicable methods to assess student learning during the training
For additional technical information, contact:
Georgia Harris at (301) 975-4014, g.harris@nist.gov
Please visit our website at www.msc-conf.com for additional information on each of these Seminars or contact Bob Fritzsche at (951)273-5518 or robert.fritzsche@navy.mil.
* NOTE: 3-day Seminars begin 8:00am Monday, March 19th, 2012 and end 5:00pm Wednesday, March 21st, 2012.